Excellent light measurement technology
Instrument Systems stands for premium German quality and profound application-oriented expertise in light and display measurement. For over 30 years we have specialized in high-quality spectroradiometers, imaging colorimeters and innovative display measurement systems. Known for highest color and luminance measurement accuracy our systems are indispensable in automobile and aviation industries, LED/luminaire manufacturing, the entertainment electronics field and in R&D labs.
Display manufacturers worldwide rely on our spectrally enhanced 2D measurement systems and software solutions for in-line production testing, end-of-line quality control and in R&D labs to characterize
- displays like LCD, LED, Micro-LED and OLED,
- AR/VR devices, laser diodes and VCSELs.
MicroLED wafer testing
With LumiTop 4000 Instrument Systems offers a measurement solution for µLED wafer testing, which creates 2-dimensional and pixel-precise optical analyses!With a resolution of 12 MP it detects smal defects and, in combination with a 100 mm macro lens, enables the rapid parallel analysis of µLEDs on a wafer.
Instrument Systems developed the PVT 110 specifically for time-resolved measurement of nanosecond pulses. This system has an extremely broad range of applications with the use of different photodiodes for power measurement and characterization of fast pulses, together with fast measurement and analysis of all resulting data flows..
The LumiTop 4000 and LumiTop 2700 imaging colorimeters from Instrument Systems are used together with a CAS spectroradiometer for measuring the luminance and color uniformity of displays in the production line. They also include a photodiode, thus combining the advantages of three different types of measuring instrument:
- Unrivalled accuracy in spectral spot measurement
- Analysis options of imaging colorimetry
- Temporal resolution of a photodiode.
The VTC is the perfect solution for single emitter characterization of VCSEL arrays. The system, consisting of a camera and corresponding microscope optics, is capable of simultaneously determining position as well as radiant power of single emitters on a VCSEL array in a single-shot camera measurement. As a result, the system allows for fast and easy detection of defect emitters on the VCSEL array.